Failure analysis using scanning electron microscopes (SEM) is essential for investigating the failure mechanisms of components and discovering the causes.
The analyses carried out can be both morphological (the fracture surface is studied at high magnifications) and “chemical” (using an EDS probe) in order to search for indicators that can highlight both the type of fracture, e.g. fatigue, ductile, brittle, and the triggers that led to it, e.g. notches, non-metallic inclusions, surface defects, etc.
Each analysis is accompanied by a report including initial assessments, SEM images and conclusions.